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Computational Storage for 3D NAND Flash Error Recovery Flow Prediction
Zambelli, C.; Miola, A.; Calore, E.; Micheloni, R.; Schifano, S. F.
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Atto di Convegno (Proceedings) |
Springer Science and Business Media Deutschland GmbH,
Lecture Notes in Electrical Engineering
Vol. 1113, No. 1, pp: 425-435, Anno: 2024 |
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Modeling 3D NAND Flash with Nonparametric Inference on Regression Coefficients for Reliable Solid-State Storage
Borghesi, Michela; Zambelli, Cristian; Micheloni, Roberto; Bonnini, Stefano
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Contributo in rivista (Pubblicazione in Rivista) |
FUTURE INTERNET
Vol. 15, No. 10, pp: 1-13, Anno: 2023 |
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Process-Voltage-Temperature Variations Assessment in Energy-Aware Resistive RAM-Based FPGAs
Rizzi, T.; Baroni, A.; Glukhov, A.; Bertozzi, D.; Wenger, C.; Ielmini, D.; Zambelli, C.
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Contributo in rivista (Pubblicazione in Rivista) |
IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY
Vol. 23, No. 3, pp: 328-336, Anno: 2023 |
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Technology-Aware Drift Resilience Analysis of RRAM Crossbar Array Configurations
Reiser, D.; Reichenbach, M.; Rizzi, T.; Baroni, A.; Fritscher, M.; Wenger, C.; Zambelli, C.; Bertozzi, D.
dettagli >>
Atto di Convegno (Proceedings) |
Institute of Electrical and Electronics Engineers Inc.,
21st IEEE Interregional NEWCAS Conference, NEWCAS 2023 - Proceedings
pp: 1-5, Anno: 2023 |
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An HPC Pipeline for Calcium Quantification of Aortic Root From Contrast-Enhanced CCT Scans
Minghini, Giada; Cavallo, Armando Ugo; Miola, Andrea; Sisini, Valentina; Calore, Enrico; Fortini, Francesca; Micheloni, Rino; Rizzo, Paola; Schifano, Sebastiano Fabio; Sega, Francesco Vieceli Dalla; Zambelli, Cristian
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Contributo in rivista (Pubblicazione in Rivista) |
IEEE ACCESS
Vol. 11, No. 1, pp: 101309-101319, Anno: 2023 |
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Insights into device and material origins and physical mechanisms behind cross temperature in 3D NAND
Pesic, M.; Beltrando, B.; Rollo, T.; Zambelli, C.; Padovani, A.; Micheloni, R.; Maji, R.; Enman, L.; Saly, M.; Bae, Y. H.; Kim, J. B.; Yim, D. K.; Larcher, L.
dettagli >>
Atto di Convegno (Proceedings) |
Institute of Electrical and Electronics Engineers Inc.,
IEEE International Reliability Physics Symposium Proceedings
Vol. 2023-, No. 1, pp: 1-8, Anno: 2023 |
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On the Reliability of RRAM-Based Neural Networks
Aziza, H.; Zambelli, C.; Hamdioui, S.; Diware, S.; Bishnoi, R.; Gebregiorgis, A.
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Atto di Convegno (Proceedings) |
IEEE Computer Society,
IEEE/IFIP International Conference on VLSI and System-on-Chip, VLSI-SoC
pp: 1-8, Anno: 2023 |
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Integrating FPGA Acceleration in the DNAssim Framework for Faster DNA-Based Data Storage Simulations
Marelli, A.; Chiozzi, T.; Battistini, N.; Zuolo, L.; Micheloni, R.; Zambelli, C.
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Contributo in rivista (Pubblicazione in Rivista) |
ELECTRONICS
Vol. 12, No. 12, pp: 2621-2639, Anno: 2023 |
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Exploring Process-Voltage-Temperature Variations Impact on 4T1R Multiplexers for Energy-aware Resistive RAM-based FPGAs
Rizzi, T.; Baroni, A.; Glukhov, A.; Bertozzi, D.; Wenger, C.; Ielmini, D.; Zambelli, C.
dettagli >>
Atto di Convegno (Proceedings) |
Institute of Electrical and Electronics Engineers Inc.,
IEEE International Integrated Reliability Workshop Final Report
Vol. 2022-, No. 1, pp: 1-5, Anno: 2022 |
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End-to-end modeling of variability-aware neural networks based on resistive-switching memory arrays
Glukhov, A; Lepri, N; Milo, V; Baroni, A; Zambelli, C; Olivo, P; Perez, E; Wenger, C; Ielmini, D
dettagli >>
Atto di Convegno (Proceedings) |
IEEE Computer Society,
IEEE/IFIP International Conference on VLSI and System-on-Chip, VLSI-SoC
pp: 1-5, Anno: 2022 |
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Statistical model of program/verify algorithms in resistive-switching memories for in-memory neural network accelerators
Glukhov, A.; Milo, V.; Baroni, A.; Lepri, N.; Zambelli, C.; Olivo, P.; Perez, E.; Wenger, C.; Ielmini, D.
dettagli >>
Atto di Convegno (Proceedings) |
Institute of Electrical and Electronics Engineers Inc.,
IEEE International Reliability Physics Symposium Proceedings
Vol. 2022-, No. 1, pp: 31-37, Anno: 2022 |
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An energy-efficient in-memory computing architecture for survival data analysis based on resistive switching memories
Baroni, A.; Glukhov, A.; Perez, E.; Wenger, C.; Calore, E.; Schifano, S. F.; Olivo, P.; Ielmini, D.; Zambelli, C.
dettagli >>
Contributo in rivista (Pubblicazione in Rivista) |
FRONTIERS IN NEUROSCIENCE
Vol. 16, No. 1, pp: 932270-1-932270-16, Anno: 2022 |
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Experimental verification and benchmark of in-memory principal component analysis by crosspoint arrays of resistive switching memory
Mannocci, P.; Baroni, A.; Melacarne, E.; Zambelli, C.; Olivo, P.; Perez, E.; Wenger, C.; Ielmini, D.
dettagli >>
Atto di Convegno (Proceedings) |
Institute of Electrical and Electronics Engineers Inc.,
Proceedings - IEEE International Symposium on Circuits and Systems
Vol. 2022, No. 1, pp: 326-330, Anno: 2022 |
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Machine Learning and Non-volatile Memories
Micheloni, R.; Zambelli, C.
dettagli >>
Libro |
Springer,
pp: 1-161, Anno: 2022 |
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In-Memory Principal Component Analysis by Crosspoint Array of Resistive Switching Memory: A new hardware approach for energy-efficient data analysis in edge computing
Mannocci, P.; Baroni, A.; Melacarne, E.; Zambelli, C.; Olivo, P.; Perez, E.; Wenger, C.; Ielmini, D.
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Contributo in rivista (Pubblicazione in Rivista) |
IEEE NANOTECHNOLOGY MAGAZINE
Vol. 16, No. 2, pp: 4-13, Anno: 2022 |
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Low Conductance State Drift Characterization and Mitigation in Resistive Switching Memories (RRAM) for Artificial Neural Networks
Baroni, A.; Glukhov, A.; Perez, E.; Wenger, C.; Ielmini, D.; Olivo, P.; Zambelli, C.
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Contributo in rivista (Pubblicazione in Rivista) |
IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY
Vol. 22, No. 3, pp: 340-347, Anno: 2022 |
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Investigating 3D NAND Flash Read Disturb Reliability with Extreme Value Analysis
Zambelli, C.; Crippa, L.; Micheloni, R.; Olivo, P.
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Contributo in rivista (Pubblicazione in Rivista) |
IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY
Vol. 21, No. 4, pp: 486-493, Anno: 2021 |
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Assessing the role of program suspend operation in 3d nand flash based solid state drives
Zambelli, C.; Zuolo, L.; Aldarese, A.; Scommegna, S.; Micheloni, R.; Olivo, P.
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Contributo in rivista (Pubblicazione in Rivista) |
ELECTRONICS
Vol. 10, No. 12, pp: 1394-1-1394-18, Anno: 2021 |
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Editorial for the special issue on flash memory devices
Zambelli, C.; Micheloni, R.
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Contributo in rivista (Pubblicazione in Rivista) |
MICROMACHINES
Vol. 12, No. 12, pp: 1566-1-1566-3, Anno: 2021 |
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A scalable bidimensional randomization scheme for tlc 3d nand flash memories
Favalli, M.; Zambelli, C.; Marelli, A.; Micheloni, R.; Olivo, P.
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Contributo in rivista (Pubblicazione in Rivista) |
MICROMACHINES
Vol. 12, No. 7, pp: 759-1-759-14, Anno: 2021 |
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